Wafer transfer tool is full of a variety of data. For example, fan noise, vibration, temperature and humidity inside the tool, power consumption, and robot position and speed are just a few examples.
Since we design and manufacture all major components of wafer transfer systems, such as EFEMs, robots and load ports, in-house, it is easy to collect data for abnormality detection, enabling us to detect abnormalities specific to the environment of wafer transfer systems.
By collecting data from numerous sensors installed in the tool and detecting conditions that differ from normal operation, we can prevent failures and stoppages.
We have also developed our own unique sensors, for example, a proximity sensor that measures the distance between the robot hand and the object being conveyed. By combining these unique sensors with AI, we can achieve more effective abnormality detection.