Omron

■ Proposal of Optimal Inspection Systems Tailored to Each Phase of Your Manufacturing Process
How can we ensure the quality of semiconductors—key to realizing a digital society—both quickly and reliably?
Omron proposes inspection systems tailored to your usage phase and objectives.

VT-X950 (For R&D Process Evaluation and Analysis)
The VT-X950 utilizes proprietary CT X-ray imaging technology to visualize fine internal structures of semiconductors—such as micro-bumps and Through Glass Vias (TGVs)—quickly and with high precision.
It strongly supports advanced technology development by enabling quantitative evaluation and analysis of semiconductor structures and facilitating rapid feedback to other processes in your cutting-edge R&D workflows.

VT-X750 Series (For Pilot Production and Line Stabilization)
The VT-X750 combines high inspection capability with speed, enabling operations such as inline inspection, 100% inspection, and automated inspection within the production process.
It contributes to stable quality control and efficient manufacturing of good products.

VP-9000 Series (For R&D Process Evaluation, Analysis, and Pilot Production)
In collaboration with CKD Corporation, Omron proposes solutions for advanced semiconductor development by leveraging both companies’ high-precision visualization technologies.
This includes comparing and linking inspection data of micro-bump processes.

In the “Technology Showcase” corner, we also introduce a collaboration with NVIDIA that uses digital twin technology to visualize X-ray exposure levels and subtle defect conditions based on both visual and non-visual inspections.

■ Proposal of Optimal Inspection Systems Tailored to Each Phase of Your Manufacturing Process
How can we ensure the quality of semiconductors—key to realizing a digital society—both quickly and reliably?
Omron proposes inspection systems tailored to your usage phase and objectives.

VT-X950 (For R&D Process Evaluation and Analysis)
The VT-X950 utilizes proprietary CT X-ray imaging technology to visualize fine internal structures of semiconductors—such as micro-bumps and Through Glass Vias (TGVs)—quickly and with high precision.
It strongly supports advanced technology development by enabling quantitative evaluation and analysis of semiconductor structures and facilitating rapid feedback to other processes in your cutting-edge R&D workflows.

VT-X750 Series (For Pilot Production and Line Stabilization)
The VT-X750 combines high inspection capability with speed, enabling operations such as inline inspection, 100% inspection, and automated inspection within the production process.
It contributes to stable quality control and efficient manufacturing of good products.

VP-9000 Series (For R&D Process Evaluation, Analysis, and Pilot Production)
In collaboration with CKD Corporation, Omron proposes solutions for advanced semiconductor development by leveraging both companies’ high-precision visualization technologies.
This includes comparing and linking inspection data of micro-bump processes.

In the “Technology Showcase” corner, we also introduce a collaboration with NVIDIA that uses digital twin technology to visualize X-ray exposure levels and subtle defect conditions based on both visual and non-visual inspections.

■ Proposal of Optimal Inspection Systems Tailored to Each Phase of Your Manufacturing Process
How can we ensure the quality of semiconductors—key to realizing a digital society—both quickly and reliably?
Omron proposes inspection systems tailored to your usage phase and objectives.

VT-X950 (For R&D Process Evaluation and Analysis)
The VT-X950 utilizes proprietary CT X-ray imaging technology to visualize fine internal structures of semiconductors—such as micro-bumps and Through Glass Vias (TGVs)—quickly and with high precision.
It strongly supports advanced technology development by enabling quantitative evaluation and analysis of semiconductor structures and facilitating rapid feedback to other processes in your cutting-edge R&D workflows.

VT-X750 Series (For Pilot Production and Line Stabilization)
The VT-X750 combines high inspection capability with speed, enabling operations such as inline inspection, 100% inspection, and automated inspection within the production process.
It contributes to stable quality control and efficient manufacturing of good products.

VP-9000 Series (For R&D Process Evaluation, Analysis, and Pilot Production)
In collaboration with CKD Corporation, Omron proposes solutions for advanced semiconductor development by leveraging both companies’ high-precision visualization technologies.
This includes comparing and linking inspection data of micro-bump processes.

In the “Technology Showcase” corner, we also introduce a collaboration with NVIDIA that uses digital twin technology to visualize X-ray exposure levels and subtle defect conditions based on both visual and non-visual inspections.