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Malvern Panalytical

  • Booth: K2175

Explore SEMI Excellence by Malvern Panalytical – Visit K2175

Overview

At SEMICON Taiwan 2025, Malvern Panalytical and Micromeritics come together to showcase a powerful synergy of world-leading analytical technologies — from structural and elemental analysis to surface area and porosity measurement — empowering semiconductor innovation at every stage of development.

With more than 92,000 instruments in use worldwide, our solutions help leading semiconductor companies optimize materials, control quality, and accelerate breakthroughs through trusted data, precision measurements, and deep scientific expertise.

Join us at Booth K2175 to discover how our integrated technologies support smarter decisions and sustainable progress across advanced electronics and next-generation manufacturing.


  Press Releases

  • Taipei, Taiwan – September 10, 2025 – Malvern Panalytical, a global leader in material characterization technologies, will spotlight its advanced suite of semiconductor metrology instruments at SEMICON Taiwan 2025, reaffirming its commitment to driving innovation and precision across the electronics industry.

    With decades of experience supporting semiconductor manufacturers, Malvern Panalytical continues to offer high-throughput, best-in-class analytical solutions tailored to meet the sector’s rapidly evolving process requirements. The company’s metrology tools are trusted by leading fabs and R&D facilities to ensure process control, improve yield, and reduce defects at every stage of the semiconductor value chain.

    Key solutions to be featured include:

    🔹 XRF – 2830 ZT
    Designed for non-destructive analysis of thin films, the 2830 ZT XRF system provides precise data on film thickness, dopant concentration, contamination levels, and surface uniformity. It supports wafers up to 300 mm and is ideal for both production and development environments.

    🔹 XRD – X’Pert³ MRD & MRD XL
    These high-resolution diffractometers deliver absolute, calibration-free data on crystal structure, phase, grading profiles, film thickness, and strain analysis. Widely used in epitaxy and materials research, they are critical tools for process monitoring and quality control.

    🔹 Crystal Orientation Range
    Malvern Panalytical offers fast, accurate orientation solutions for boules, ingots, pucks, and wafers. Supporting both research and inline inspection, these systems enable high-precision alignment and mapping for a wide range of single crystalline materials.

    “Precision metrology is at the heart of successful semiconductor innovation,” said [Insert Name], Regional Manager at Malvern Panalytical. “From material characterization to in-line inspection, our portfolio supports customers in navigating tighter tolerances, smaller nodes, and higher yields.”

    Visit Booth K2175 to learn how Malvern Panalytical’s X-ray-based solutions are enabling the next generation of semiconductor manufacturing through speed, accuracy, and scientific integrity.


    About Malvern Panalytical
    Malvern Panalytical is a global leader in material characterization, with over 92,000 instruments in use worldwide. Its solutions are trusted across electronics, pharmaceuticals, mining, and academia to provide accurate, actionable insights through advanced analytical technologies.


  Products

  • SDCOM-Crystal orientation range
    Ultra-fast, top surface measuring crystal orientation in a compact package...

  • Malvern Panalytical’s SDCOM is a compact, user-friendly X-ray diffraction (XRD) system designed for rapid and accurate crystal orientation in semiconductor wafer processing and research.

    Using an advanced azimuthal scan method, it delivers precise orientation results in under 10 seconds with up to 0.01° accuracy.

    Supporting samples from 2 mm to 300 mm, SDCOM is compatible with a wide range of materials and applications, including Si, GaAs, GaN, and sapphire.

    The system’s compact size, air-cooled design, and intuitive software make it easy to integrate into both R&D and production workflows.

    Optional accessories like wafer mapping stages and Theta-scan expand its flexibility.

    With non-destructive testing, low running costs, and reliable data, SDCOM helps semiconductor manufacturers accelerate innovation, ensure quality control, and optimize yield across crystal growth, boule inspection, and wafer metrology processes.

  • X'Pert³ MRD
    Versatile research & development XRD system...

  • The long and successful history of Malvern Panalytical's Materials Research Diffractometers (MRD) continues with a new generation – X’Pert³ MRD and X’Pert³ MRD XL. The improved performance and reliability of the new platform have added more analytical capability and power for X-ray scattering studies in: 

    • advanced materials science 
    • scientific and industrial thin film technology 
    • metrological characterization in semiconductor process development
  • X'Pert³ MRD XL
    Enables High-Precision Wafer Mapping up to 200 mm...

  • The long and successful history of Malvern Panalytical's Materials Research Diffractometers (MRD) continues with the generation of X’Pert³ MRD XL. The improved performance and reliability of the new platform have added more analytical capability and power for X-ray scattering studies in:

    • advanced materials science
    • scientific and industrial thin film technology
    • metrological characterization in semiconductor process development

  • 2830 ZT
    Advanced semiconductor thin film metrology solution...

  • The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.