Keysight Technologies Taiwan Ltd.

Keysight Technologies’ Electrical Structural Test (EST) Solution utilizes capacitive technology to enhance defect detection in IC wire bonds, identifying issues like near-shorts, stray wires, and wire sags. It tackles Electrical Overstress (EOS) effects, helping to improve chip integrity, reduce product returns, and ensure the reliability of electronic products. The Electrical Structural Test (EST) supports 20 parallel test sites, enabling a high throughput with a Units Per Hour (UPH) rate of about 58,000, optimizing production testing efficiency. Suitable for various package types such as QFP, QFN, and BGA, it integrates well with strip and singulated handlers, making it a versatile tool in electronic package testing. The system comes with an analytics software that provides a deeper understanding of data, unlocking hidden patterns and opportunities for optimization and yield improvement. Its predictive maintenance capabilities forecast potential failures, allowing for preemptive actions that reduce downtime and extend the equipment's lifespan.

Keysight Electrical Structural Test Advanced Visualization Software (ESTAV) is designed to extend the capabilities of the S8050 Electrical Structural Tester by enabling advanced offline analysis of STDF data. High-volume production data can be ingested rapidly, allowing yield diagnostics, failure pattern recognition, and test optimization to be performed within minutes.

Comprehensive test insights are delivered through interactive heatmaps, binning summaries, and Z-score-based outlier detection. Performance across lots, test sites, and process variations can be effortlessly compared, and anomalies can be visualized with high precision. Manual debug efforts are significantly reduced, test limits can be fine-tuned with confidence, and faster resolution of yield excursions is supported—ensuring better control, improved quality, and higher throughput across structural test operations.

The UXR‑Series Oscilloscopes offer 5 to 110 GHz of bandwidth, with the most comprehensive set of probing, analysis applications, and measurements for advanced technologies, and most accurate oscilloscope at any bandwidth - lowest noise, highest ENOB, and 10-bit vertical resolution enable you to see the truest representation of of your signal.

The M8000-Series BERT offer the most comprehensive choices, from affordable manufacturing test to high-performance characterization and compliance test, supports symbol rates up to 120 Gbaud with non-return-to-zero and pulse amplitude modulation 4/6/8 coding schemes. It also supports digital interfaces such as PCI Express®, USB, MIPI, Thunderbolt, DisplayPort, SATA / SAS, electrical and optical Ethernet 10G / 100G / 400G / 800G / 1.6T / 3.2T, OIF-CEI, Fibre Channel, and PON.

The DCA-M family is the industry standard for verifying optical transmitter compliance. With single to quad optical and electrical channels in a compact design, it suits both R&D and manufacturing. Its low-noise, high-sensitivity receivers support multimode and single-mode signals across data rates from 1 Gb/s to 120 Gbaud. Models offer up to 50 GHz bandwidth and intrinsic jitter as low as 90 fs RMS, delivering high-precision measurements for both optical and electrical devices.