Xtreme Testek Inc.: An Innovative Pioneer in High-Power Semiconductor Measurement
Xtreme Testek Inc. is a technology leader in the field of third-generation semiconductor measurement. We specialize in the electronic characterization of semiconductors such as SiC (Silicon Carbide) and GaN (Gallium Nitride). Leveraging our proprietary, state-of-the-art platform which seamlessly integrates harsh testing conditions like high current, high voltage, high frequency, and high temperature, we can precisely perform both static and dynamic characterization of SiC and GaN.
To meet the diverse development needs of our clients, we offer flexible business models that include professional "outsourced testing services" and the sale of highly efficient "test platforms." We are committed to being your strongest partner in research, development, and production.
Our core expertise extends beyond just measurement. By leveraging our deep knowledge accumulated in the high-power and high-frequency wireless domains, we have successfully expanded our proficiency into cutting-edge application markets. We provide high-performance Power Amplifier (PA) modules and smart antennas for Low Earth Orbit (LEO) satellites and unmanned communications (drones, robots). Concurrently, we also deliver stable and reliable system solutions for smart electricity meters, smart gas meters, and green energy monitoring systems.
Xtreme Testek Inc. is more than just a measurement expert; we are your partner in advancing into the high-performance era.
產品特色：
準確量測：支援電容、Q、ESR、ESL、I.R.、耐電壓等測試
快速測試：多通道架構，有效提升量產 UPH
多點並測：支援 Multi-DUT 並行測試
彈性整合：可搭配 Probe Card、Fixture 與自動化設備
量產導向：適合晶圓級測試與自動化生產線整合
客製化設計：依 DUT、測試規格及產線需求彈性配置