Chroma's SoC Test System, the 3680, provides flexible configurations and a wide range of coverage, enabling you to test various device types on a single platform.
The system is specifically designed for high-throughput and high parallel testing ability to provide the best solution for fabless, IDM and testing houses.
With comprehensive test capability, high accuracy, powerful software, and excellent reliability, the 3680 is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
■ 24 interchangeable slots for digital, analog and mixed-signal applications
■ Data rate up to 1Gbps
■ Up to 2048 sites parallel test
■ Up to 2048 digital I/O pins
■ 256 MW vector memory (512 MW option) (X2 mode)
■ Up to 64 CH PMU for high precision measurement
■ Per-pin timing measurement unit/PPMU/frequency measurement
■ SCAN up to 64 chains/16G depth
■ Edge placement accuracy (EPA): ±150ps
■ Up to 128 CH high density DPS32
■ High density HDADDA2 mixed-signal option
■ Efficient high power HCDPS analog option
■ High performance HDAVO option
■ High density HDVI analog option
■ High density HDRF2 option
■ Direct probing system*
■ Multi-time domain function*
■ Microsoft Windows® 10 OS
■ C#.NET and GUI programming interface
■ CRISPro, full suite of intuitive software tools
■ Test program and pattern converters for other platforms
■ Accept PIB and probe card of other testers directly
■ Support STDF data output and customized data format
■ Air-cooled, small footprint tester-in-a-test-head design