Johnstech International Corporation

High Compliance: The probe's advanced design allows for superior compliance, enabling it to maintain contact with test points even in challenging conditions. Overcome package variations such as housing bow, non-coplanarity and package warp.

Reliability: Built with high-quality materials, HERØHCTM offers long-term reliability and consistent performance, reducing downtime and maintenance costs.

Durability: With a robust construction, HERØHCTM is capable of withstanding frequent use in demanding test environments, ensuring a long service life.

Compatibility: The probe is compatible with a wide range of test equipment, making it a versatile solution for various testing applications.

All Contactors will be available for Engineering test/characterization with a Manual Actuator and are ready for high-volume automated testing.

Improved Test Accuracy: High compliance and precision ensure accurate test results, enhancing overall test quality.

Increased Efficiency: HERØHC’sTM reliability and durability reduce downtime, allowing for more efficient testing processes.

Versatile Application: Compatible with various test equipment, the HERØHCTM offers flexibility for diverse testing requirements.

High Frequency Capability: The contactor is engineered to handle high-frequency signals with minimal signal loss, ensuring accurate and reliable test results.

Spring Probe Design: Utilizing high-quality spring probes, the contactor offers optimal contact force to maintain reliable contact with test points.

Low Insertion Loss: The contactor's design minimizes insertion loss, preserving signal integrity and ensuring accurate measurement data.

Durable Construction: Built with robust materials, the contactor is capable of withstanding frequent use in challenging test environments.

Compatibility: The contactor is compatible with a wide range of test equipment, making it a versatile solution for various high-frequency testing applications.

• Suitable for BGA, LGA, QFN, and WLCSP applications.
• Designed with single-ended architecture to minimize Cres variability.
• Easy in-line cleaning with Pd alloy probe tips that stick out further than the competition.
• Very good compliance with a 1mm Test Height.
• All Contactors are available for Engineering test characterization with a Manual Actuator and are ready for high-volume automated testing.
• Ideal for Gallium Nitride (GaN) and Silicon Carbide (SiC) applications.

Johnstech International, a global leader in the semiconductor test industry, has added two spring probe product lines to their premium test portfolio. Engineered by industry experts with more than 30 years of spring pin design expertise, Johnstech’s SHOTO™ test solution offers a reliable, cost effective, top-of-the-line test contactor manufactured specifically for the highly competitive commercial test marketplace.

Available with crown and spear tips, the SHOTO product line is suitable for BGA, LGA, QFN, and WLCSP applications. Additionally, the SHOTO 3.0mm test height features a single-end architecture to maximize CRES stability, provide compliance flexibility, and frequency performance for both small and large array packages. Each solution is compatible with a floating alignment plate for accuracy and the Pd-alloy tip is easy-to-clean, lengthening MTBA.

• Pitches down to 0.2mm
• Frequencies up to ≈25GHz to be targeted
• Package sizes up to 20x20 mm
• High RF performance
• Environmental Temperature Range -60 to 175°C
• Reliability Typical Probe Life 500,000 cycles

All Contactors will be available for Engineering test/ Characterization with a Manual Actuator and are ready for high-volume Automated Testing.

Partner with Johnstech and get your contactor J-tuned™. When your contactor solution is J-tuned™ we save you time and money by highlighting performance enhancement opportunities for your contactor. Our system-level approach to modeling coupled with our tunable contact solutions can simply predict the performance of your contactor, or expand to include your device, load board, and contactor system. Performance optimization also extends to mechanical & thermal modeling giving you a 360° view of your device’s performance.

Typical modifications resulting from J-tuning:

• An optimized contactor interface to your load board design
• Package Layout Simulation from Device to I/O
• Trace and pad characteristics
• Impedance Optimization
• And more….