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Exosens

MERIGNAC,  France
https://www.exosens.com/
  • Booth: 2082

WELCOME TO BOOTH 2082!

Overview

At SEMICON West, Exosens a world leader in revealing the invisible —together with our brands Photonis and Xenics—will showcase advanced imaging technologies purpose-built for advanced semiconductor inspection and in-line monitoring.

Our solutions include SWIR Microscopy for high-resolution imaging beyond the visible spectrum to detect sub-surface features, material defects, and wafer-level anomalies; LWIR Thermography for precise thermal mapping that identifies hotspots, process deviations, and equipment reliability issues in real time; and Dark Field Inspection, which enhances defect detection by capturing scattered light from particles, scratches, and edge flaws on wafers and photomasks.

Spanning UV to LWIR, our sensors, cores, and cameras deliver industrial-grade performance at competitive cost, helping fabs and equipment makers increase yield, reduce downtime, and accelerate throughput.


  Press Releases

  • Revolutionizing 3D Printing with extreme-speed thermographic SWIR imaging

    In the MultipLICITY project, Xenics, part of Exosens is part of a team to break new ground in additive manufacturing by integrating real-time, short-wave infrared (SWIR) imaging for advanced process monitoring and defect detection.

    At the forefront of this innovation is the Cheetah+, Xenics' high-speed SWIR camera. Tailored for the demands of 3D printing, the Cheetah+ captures ultra-fast, spectrally rich data produced by multiple lasers, ideal for multi-material 3D printing applications.

    Key Features of the Cheetah+ Camera:

    Region of Interest (RoI) Functionality

    Focus on specific areas spatially or spectrally, enhancing imaging speed (up to 60kHz with RoI, 1700 Hz full-frame) while reducing data load. RoI targets critical zones such as:

    • Melt pools in laser sintering
    • Material transition interfaces
    • Potential voids or irregularities
    Thermographic Precision Calibration

    The Cheetah+ offers unparalleled speed and traceable accuracy, allowing precise temperature measurement of targets. This ensures consistent quality control, improved process efficiency, and reduced waste — enabling defect-free component manufacturing with enhanced sustainability.

    With these advancements in SWIR imaging, the MultipLICITY project accelerates the evolution of smarter, faster, and more adaptive 3D printing technologies.

    About MultipLICITY

    This initiative is part of an imec.icon research project, supported by IMEC and Agentschap Innoveren & Ondernemen.

    MultipLICITY project | Exosens


  Products

  • Wildcat+ series
    Wildcat+ series: Compact, high performance InGaAs cameras with low noise and high dynamic range. Suitable for silicon ingot, wafer and die inspections....

  • The Wildcat+ series is based on a state-of-the art uncooled InGaAs detector with 640 x 512 pixels and 20 μm pixel pitch (Wildcat+ 640/Wildcat+ TE0 and WL series) or 1280 x 1024 pixels and 5 μm pixel pitch (Wildcat+ 1280 series).

    Wildcat/Wildcat+ cameras come with a CameraLink or USB3 Vision interfaces with low weight and power. Wildcat+ cameras are suitable for semiconductor inspection, display inspection and laser beam analysis. 

    For more information: High resolution SWIR camera -Wildcat | Exosens

  • Ceres T 1280 series
    Ceres T series: High performance thermographic cameras to detect thermal defects and ensuring uniform temperature distribution in wafer manufacturing...

  • The Ceres T 1280 series is based upon the Dione 1280 OEM thermal imaging core with 1280x1024 pixels and 12 μm pixel pitch. The camera offers superior on-board thermographic performance (accuracy, stability) in the temperature range up to 400 °C.

    The Ceres T 1280 camera outputs full frame images at 60 Hz via either a CameraLink or at 45 Hz via GigE Vision interface. The compact size, excellent thermographic stability and accuracy, and GenICam compliant interfacing allow for easy integration in demanding industrial thermography applications.

    For more information: Ceres T 1280 series | Exosens

  • iNocturn series
    Ultra-sensitive intensified cameras for dark field wafer surface inspections....

  • The superior intensified camera extracting the best of image intensifier tube and sensitive low light camera. The iNocturn features a unique combination of ultra-sensitivity, high framerate, high-QE photodetectors, and nano-second gating.

    The High QE image intensifier comes with different range of wavelength spanning from UV to Near Infrared enabling the user to focus on a specific range of wavelength for a particular application. For example, the iNocturn Blue can be used for applications that include wafer inspection, spectroscopy and microscopy. 

    For more information: Intensified camera | Exosens


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