Welcome to the cyberTECHNOLOGIES online showcase.
Overview
cyberTECHNOLOGIES is the leading provider of standalone and integrated high resolution 3D Optical Metrology Systems for non-destructive process control of surface topography, roughness and quality inspections well as Total Thickness Variation (TTV) of most any surface on Semiconductor Wafers, Glass Products, MEMS, Solar Cells, Fuel Cells, Printed or Jetted Products, Chip Packages and many other devices.
Our systems reliably measure on absorbent, highly reflective, soft or transparent materials with high vertical and lateral resolution down to sub-nm, even over large areas of interest and with large measurement ranges. Our In-house software development provides our customers with an easy-to-use system that provides superior automation capabilities, high speed, accuracy, comprehensive data analysis capabilities in R&D and production in industries as varied as medical devices, semiconductors, solar, hybrid, MEMS, automotive, pharmaceutical as well as optics manufacturing.