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Solarius

San Jose,  CA 
United States
http://www.solarius-inc.com
  • Booth: 6383

Categories

203 Inspection & Measurement Products
  • Film Thickness; Uniformity Measurement; Ellipsometer
  • Line Width; Critical Dimension (CD) Measurement
  • Metrology; Topology; Nanotopography; Flatness; Cryst.Orient.
  • Microscopes: Optical Microscopes
  • Microscopes: Confocal Scanning; 3-D Video
  • Overlay Measurement
  • Defect; Particle; Contam. Detection/Review/Inspect.
  • Die Inspection; Die Shear
  • Package Inspection; Lead Scanners
  • Stress; Refractive Index; Reflectivity/Conductivity Meas.
  • Fiber Optic Inspection Instruments
    • 205 Nanotechnology Equipment and Tools
  • Equipment, Nanotechnology Tools
    • 206 PV Equipment
  • Inspection and Metrology
    • 208 Test Equipment
  • Optical Test Systems
  • Wireless, non-contact Test Systems
    • 400 Components, Parts & Accessories
  • Sensors

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