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Zhejiang Hangke Instrument Co., Ltd.

Hangzhou,  Zhejiang Province 
China
https://www.hkyq.com.cn/
  • Booth: 467

Leader in the semiconductor reliability test field in China.

Overview

Zhejiang Hangke Instrument Co., Ltd. is a high-end equipment manufacturing company with a long history and rich technological heritage, headquartered in Hangzhou, China. The company focuses on semiconductor reliability test and special power supply fields, and is a professional testing solution provider, efficient testing system service provider, and leading electronic power equipment developer. Since its inception, the company has always adhered to client needs, insist independent research and development, and after decades of innovation accumulation, it now has burn-in screening equipment and testing systems covering the entire series of electronic components. It has also undertaken many national key engineering supporting tasks and has been repeatedly awarded for excellent quality. 
The company currently has over 300 employees, with more than 50% being professional technical personnel, 68 patents in reserve. Its mature sales system and excellent after-sales team can quickly respond to client needs, and its products and services have reached all over the country, receiving long-term recognition from numerous clients.

  Products

  • IGBT power cycle test system PC3000A
    The system is suitable for power cycling test of various sizes of IGBT modules and uses the advanced JEDEC static test method (JESD51-1) to generate temperature changes by varying the input power of the electronic component....

    • The system is suitable for power cycling test of various sizes of IGBT modules and uses the advanced JEDEC static test method (JESD51-1) to generate temperature changes by varying the input power of the electronic component. During the change, through transient temperature response curve of the tested chip and data processing of the test waveformto obtain the full thermal characteristics of the electronic component.
    *Supports minute/second power cycling test
    *Equipped with oil-cooled platform, which can quickly and automatically calibrate the K-factor of the component
    *Fixture supports adjustable strength and depth for effective clamping of different packaging of modules
    *With solenoid water valve, can automatically adjust the cooling water flow according to the actual situation, or manually adjust
    *Through the transient temperature response curve of the test component, data processing of the test waveform to obtain the comprehensive thermal characteristics of the electronic component
    *Full experimenter human safety considerations are set
  • LSIC burn-in test system 7000
    The system supports dual temperature zones, and can carry out HTOL burn-in test at room temperature +10°C~+150°C, and detect the output signal of the device in real time during the burn-in process, in which the vectors are automatically compared....

    • The system supports dual temperature zones, and can carry out HTOL burn-in test at room temperature +10°C~+150°C, and detect the output signal of the device in real time during the burn-in process, in which the vectors are automatically compared.

    *Each burn-in board provides 8 programmable power supplies (0.5~10V/0~25A), and the power supply specifications can be customized individually
    *Each burn-in board is available with 184 DR channels and 32 bidirectional I/O channels
    *Each chamber can support up to 4 kw of heat dissipation
    *Vector files in STIL, VCT, VEC formats can be directly imported and used
    *Chip BIST test is allowed
    *Fully compatible with DL601H machined burn-in boards, plug and play
    *Full experimenter human safety considerations are set
  • HTRB 2000
    The system can perform the high temperature reverse bias burn-in test at room temperature +10℃~+200℃, can monitor the leakage current state and voltage state of the tested component in real time, record and export the burn-in test data as required....

    • The system can perform the high temperature reverse bias burn-in test at room temperature +10℃~+200℃. During the burn-in process, it can monitor the leakage current state and voltage state of the tested component in real time, record and export the burn-in test data as required.
    *nA level leakage current detection accuracy
    *30s full station data refresh of the machine
    *Unique high-voltage suppression circuit, instantaneous breakdown of components, without affecting burn-in process of other stations
    *Customized independent control function of burn-in voltage of the work station to eliminate the burn-in overrun of a single station
    *Customizable positive and negative power supplies to achieve simultaneous application of bias voltage to the upper and lower bridges of the module
    *Full experimenter human safety considerations are set

Categories

1 FLEX
  • Power & Batteries
  • Tools & Equipment
    • 100 Electronic System Design
  • Test Tools and Services
    • 208 Test Equipment
  • Burn-In Accessory Systems
  • Burn-In Systems
    • 309 Test Materials
  • Boards: Burn-In; Performance (Low/High Temp and Ceramic)

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