Teltec Semiconductor Pacific Limited

Hong Kong,  China
http://www.teltec.asia
  • Booth: 3323

Welcome to TELTEC Pacific‘s booth - N3.3323

Overview

Celebrating our 40th anniversary this year, Teltec Semiconductor Pacific Ltd (www.teltec.asia) has been recognized as the leading Sales & Service Organization serving the Semiconductor Industry (Front & Backend) in the Asia-Pacific region.

Applications:

1) Substrate Activation/Cleaning: UVO Cleaners, Plasma Cleaning Systems

2) Failure Analysis: Bond Testers, Decapsulation Systems, Scanning Acoustic Microscopes, IV Curve Tracers, TDR, X-ray Inspection Machines

3) Reliability: Burn-in & Reflow Ovens, Centrifuges, Solderability Testers

4) IC Testing: Automated Wafer Probe Stations, IC Testers & Handlers, Harddockings, Interfaces, Manipulators

5) Photolithography: Mask Aligners, Nanoimprinters, Photoresists, Solar Simulators, Wafer Bonders

6) Metrology: AFM, Optical Profilers, Nanoindentors, Thin Film Thickness and Stress Measurement Systems, Thermal Warpage & Strain Measurement Systems

7) Deposition & Etching: ALD, Plasma Deposition & Etching Systems, Sputtering & Evaporation Systems

8) Production: AOI Machines, Strip Grinders, Auto Molding Systems, Die Bonders, Flip Chip Bonders, Multi-die Bonders, Ball Mount Systems

Address: Rm. 2802 Wing On House, 71 Des Voeux Road, Central, Hong Kong
Tel: (852) 2521 4213
Email: [email protected]


  Press Releases

  • 原位对准晶圆键合机

    晶圆对准键合机, 广泛应用于MEMS 器件, 晶圆级封装技术(WLP), 先进真空封装基底,TSV 3D 互联工艺等。

    AWB-04 : 可键合3”, 4” 及 6” 晶圆
    AWB-08 : 可键合 6” 及 8” 晶圆

    键合技术:

    • 特的原位对准技术,对位精度1um(配置可见光源和红外光源)
    • 腔室气压范围10-6mbar到2bar(绝对压力)
    • 上下晶圆间距可达30mm(满足多片晶圆键合工艺)
    • 上下压盘温度独立控制,最高温度可达560℃
    • 原位等离子活化技术,可实现低温直接键合
    • 键合压力可达40kN
    • 阳极键合电压可达2.5kV
    • 小尺寸芯片键合夹具可选
    • 紫外固化功能可选
    • 近红外相机可选(适用于高掺杂晶圆)

    ROCK-04 : 可键合3”, 4” 及 6”晶圆
    ROCK-08 : 可键合 6” 及 8” 晶圆

    键合技术:
    具有与 AWB 相同的功能及以下附加功能:

    • 超高真空能力,可达10-8mbar,通过Cryo-pumping系统获得
    • 未来可实现自动装载功能

    AML键合工艺

    • 阳极键合
    • 直接键合(高温&低温)
    • 共晶键合
    • 热压键合
    • SLID 低温固液扩散键合
    • 黏合剂键合(热固化&UV固化)
    • 玻璃键合
    • 多种组合键合
  • 纳米压印机

    CNI v3.0-桌面式纳米压印设备

    容易复制微纳米结构,支持热压和紫外(UV)压印,即插即用,用途广泛,专为R&D设计。

    特点:

    1. 桌面尺寸的纳米压印工具
    2. 热压印温度最高可达250℃
    3. 紫外压印采用365 nm曝光波长(选配 405nm)
    4. 压印压力从0.3 bar至11 bar
    5. 真空条件下压印(降至1 mbar)
    6. 模板和基片尺寸:最大可达直径 210 mm
    7. 适用于各种不同形状的模板和基片
    8. 简单而坚固的工具很容易修复
    9. 手动装入、取出模板和基片,过程全自动控制
    10. 所有配方和处理流程的日志记录
  • SEM及FIB设备

    Helios 5激光PFIB系统
    将一流的单色Elstar扫描电子显微镜(SEM) 柱与等离子聚焦离子束 (PFIB)和飞秒激光相结合,以产生具有原位消融能力的高分辨率成像和分析工具,提供前所未有的材料去除率,以纳米分辨率进行快速毫米尺度表征。

    统计相关的地下和三维表征
    飞秒激光器可以以比典型镓FIB快几个数量级的速度切割许多材料;可以在5分钟内创建一个大(100微米)的横截面。由于激光具有不同的去除机制(消融与FIB的离子溅射),它可以很容易地处理具有挑战性的材料,如不导电或离子束敏感样品。

    高质量的大批量分析
    飞秒激光脉冲的持续时间极短,几乎没有产生任何伪影,如热冲击、微裂纹、熔化或典型的传统机械抛光。在大多数情况下,激光研磨的表面足够干净,可以进行直接的SEM成像,甚至可以进行电子反向散射(EBSD)映射等表面敏感技术。

    该仪器建立在经过验证的Helios 5 PFIB平台上,结合了一套最先进的技术,可提供高性能、高分辨率透射电子显微镜(TEM)和原子探针断层扫描(APT)样品制备以及具有精确材料对比度的极高分辨率SEM成像。

    主要特点

    • 快速材料去除 : 毫米级截面,材料去除速度比典型的镓聚焦离子束快15000 倍。
    • 统计相关的地下和三维数据分析 : 在更短的时间内获取更大数量的数据。
    • 准确且可重复的切割放置 : 所有3 根梁(SEM/PFIB/ 激光)的相同重合点可以实现准确和可重复的切割放置和3D 表征。
    • 深层地下特征的快速表征 : 提取地下TEM 薄片或块进行3D 分析。
    • 具有挑战性的材料的高吞吐量处理 : 包括不导电或离子束敏感样品。
    • 快速简便地表征空气敏感样品 : 无需在不同的仪器之间传输样品进行成像和横截面。
    • 共享Helios 5 PFIB 平台的所有功能 : 高质量的无镓TEM 和APT 样品制备和高分辨率成像能力。

    Apreo 2 SEM 场发射扫描电镜

    主要特点

    • 优异的空间分辨率及衬度
    • 广泛的样品适用性
    • 利用ColorSEM 技术实时获取定量能谱数据
    • 快速简便的样品装载过程
    • 高度自动化
    • 大工作距离成像

    电气故障分析
    ELITE 系统

    锁相红外热成像系统,其增强锁相热发射功能用于定位半导体器件中的缺陷

    先进的封装应用、复杂的互连方案和更高性能的功率器件的快速增长给故障定位和分析带来了前所未有的挑战。有缺陷或性能不佳的半导体器件通常表现出局部功率损耗的异常分布,导致局部温度升高。Thermo Scientific ELITE 系统利用锁相红外热成像 (LIT) 进行半导体器件故障定位, 可以准确有效地定位这些目标区域。

    LIT 是一种动态红外热成像形式,与稳态热成像相比,其可提供更好的信噪比、更高的灵敏度和更高的特征分辨率。LIT 可在 IC 半导体失效分析中用于定位线路短路、ESD 缺陷、氧化损坏、缺陷晶体管和二极管以及器件闩锁。LIT 可在自然环境中进行,无需光屏蔽箱。

    ELITE 的主要特点
    堆叠裸片分析 堆叠裸片给分析员带来了独特的挑战。处理粘合或 TSV 裸片堆栈时,LIT 可用于定位完全封装的器件上裸片堆栈内 X、Y 和 Z 深度的缺陷。

    采集时间越长,灵敏度越高 系统采集数据的时间越长,灵敏度越高。当试图以极低的功率级采集数据或必须从弱故障模式中采集数据时,锁相红外热成像ELITE 系统的这一特点尤其有价值。

    锁相红外热成像系统的功能:
    • 市售极高灵敏度热发射系统
    • 实时锁相测量
    • 几秒钟后温差分辨率 < 1 mK ;几小时后 < 10 μK
    • 非接触绝对温度测绘
    • 完全封装和堆叠裸片分析
    • 六位转轮,带有针对 MWIR 发射优化的定制透镜

  • Photoresists (For Lift-Off, MEMS, E-beam Lithography, Compound Semiconductor, Wafer Bonding and Wafer Level Packaging)

    Permanent Photo-Patternable Epoxies

    SU-8 3000 Series - Permanent Epoxy Negative Resists
    • Wide range of film thicknesses in a single coat: 0.5-200μm
    • Aspect ratio: >5:1
    • Reduced coating stress
    • Improved substrate adhesion
    • High thermal stability(<250°C)
    • High chemical stability(After hard bake)
    • Broad Application: MEMS,Opto-electronics,
      DRIE etch mask, Microfluidics, Displays etc.

    SU-8 TF 6000 Series - High Resolution Thin Resists
    • Photo imageable thin film (0.5 to 10μm) with high resolution patterning capability
    • Broadband sensitive (i, g and h-line)
    • Low temperature cure (<150°C), photo thermal or thermal only cure
    • Highly uniform thin coatings
    • Good adhesion to rigid and flexible substrates

    KMPR 1000 Series - Temporary/Permanent High Aspect Ratio Negative Resists
    KMPR is used as the DRIE etching mask with high aspect ratio pattern. It has also been widely used as a plating mold for MEMS and biological devices. Compared with SU-8, because KPMR reduces cross-link density, make it easier to strip before hard baked. KMPR can be developed in any PMGEA or TMAH developer.

    • High aspect ratio imaging(>5:1) with vertical sidewalls
    • 5-100μm in a single spin coat
    • Excellent metal adhesion
    • Excellent plating bath stability

    PermiNex Permanent Wafer Bonding Adhesives
    Permanent Wafer Bonding Adhesives for Non-Hermetic Applications
    PermiNex 1000 - Solvent Base Develop
    PermiNex 2000 - Aqueous Base Develop
    PermiNex 1000 and 2000 series are Photo Imageable Wafer Bonding Adhesive, can be used to make the cavity structures. For example, the BAW / SAW / CIS packaging and microfluidic applications requiring precision alignment and low-temperature processes
    Material Attributes:
    • Permanent Wafer Bonding Adhesives for Non-Hermetic Applications
    • Negative Resists
    • Low-metal corrosion
    • Aspect ratio up to 3:1
    • Low process temperature(<200C)
    • High-quality, void free bonding
    • Superb adhesion to Silicon and Glass
    • Work well with subsequent processes (cutting, welding, etc.) and high reliability (HAST, TST)

    Permanent Photo-Patternable Epoxies

    KMSF 1000 Low Stress Photo-dielectric
    Material Attributes:
    • Negative-tone, photoimageable dielectric
    • Low temperature cure (≤175°C )
    • Low residual stress and ultra - low warpage
    • High elongation to failure and moderate tensile strength
    • Excellent resistance to standard chemicals
    • Low shrinkage on cure and good thermal stability
    • Good adhesion to Si, SiO2, SiN, Cu and Pl
    • Applications : Stress buffer, passivation, RDL

    KMSF 2000 Low Dk/Df Photo-dielectric
    Material Attributes:
    • Negative - tone, photoimageable dielectric
    • Low temperature cure (≤200°C)
    • 5-10 μm film thickness after cure
    • Good thermal and chemical stability
    • Can replace polymide film
    • Application : Wafer Level Package

    Temporary Lift-Off Resists

    PMGI LOR Bi-Layer Lift-Off Resists
    Material Attributes:
    • Enables high resolution (<0.25μm) metallization lift-off
    • Enables thick metal deposition (>3μm)
    • Excellent adhesion to Si , GaAs , GaN substrates
    • Clean lift-off , even after very high temperature processing
    • Often used in the metal deposition process in III-V, microLED and other applications

    LOR C
    • Complete filling of hole / trenches of aspect ratio (> 1:5) without voids/ bubbles
    • The surface flattening effect can be achieved by high heat reflow
    • Excellent adhesion to Si, GaAs, GaN substrates
    • High thermal stability(<300°C)
    • Clean lift-off, even after very high temperature processing

    Single Layer Lift-Off Processes

    UniLOR N
    • Negative Photoresists for Single Layer Liff-off Processes
    • 1 to 5 μm film thickness in a single coat
    • Adjustable sidewall profile angle
    • Aqueous alkaline development (standard 0.26N TMAH developers)
    • Pattem thermal stability up to 200°C
    • Clean removal with standard photoresist removal chemistries
    • Suitable for metal evaporation physical vapor deposition
    • Good adhesion to various substrates

    Positive Resist for E-Beam Process

    PMMA & Copolymer (MMA (8.5) MAA)
    PMMA (Polymethacrylate) is a polymeric material well-suited for many imaging and non-imaging micro-electronic applications. PMMA is commonly used for direct write e-beam processes such as T-gate fabrication. PMMA is also used for temporary wafer bonding processes such as wafer thinning, where it's used as a protective layer and the temporary adhesive. PMMA resists are PMMA polymers of specific molecular weights that are dissolved in a solvent, such as anisole (a safer solvent) and then filtered. Exposure, direct write e-beam or X-ray typically, causes a chain scission of the polymer, resulting in a solubility differential between the exposed and unexposed regions of the resist film, leading to very high resolution patterning.
    • Well suited for direct write e-beam & X-ray
    • High resolution: <0.1μm
    • Wide range of molecular weights and viscosities available
    • Applications include e-beam writing, multi-layer T-gate lift-off, wafer thinning, etc.
    Copolymer resists are based on a mixture of MMA and 8.5% methacrylic acid. Copolymer (8.5) MAA is commonly used in combination with PMMA in bi-layer lift-off processes where independent CD control of the bi-layer resist stack is required. Standard copolymer resists are formulated in ethyl lactate and are available in a broad range of viscosities (film thicknesses).

    Temporary Plating Resists

    TempKoat™ N 15 - Thick, Negative-tone Temporary Resist
    • Thick Photoresist for electroplating
    • 7 to 20 μm film thickness in a single coat
    • Compatible with typical microbump and RDL plating chemistries

    TempKoat™ P 20 - Thick, Positive-tone Temporary Resist
    • Thick Photoresist for electroplating
    • 10 to 40 μm film thickness in a single coat
    • Compatible with typical microbump and RDL plating chemistries

  • 2030 DWMS

    MVP’s 2030 DWMS (Die Wire Metrology System) is a new dedicated lead frame inspection AOI and uses advanced optic and handling solutions to provide the latest in Die and Wire-Bond inspection. Inspection techniques include high-resolution telecentric imaging, quad color lighting, and 3D techniques to provide the maximum defect, and measurement capabilities for Lead Frame, Die Epoxy, and Wire Bond inspection.

    MVP’s 2030 DWMS AOI system is configured as standard with integrated MVP leadframe magazine loaders and unloaders designed for error free operation at the highest of UPH demands.

    Key Features

    • Integrated Magazine Loaders/Unloaders
    • UPH capability in excess of 150,000
    • Die Placement Metrology
    • Epoxy Spread and Bridging
    • Die Surface, Edge Crack Detection
    • Au, Al, Ag, and Cu Wires to 1um Resolution
    • Leadframe Integrity
    • SMT Components
    • Certified for SEMI S2, S8 and IEC 61010-1

    Options

    • Automatic Defect Assignment
    • AutoWidth
    • Optional 3D Epoxy Height Measurement
    • SECS/GEM

    Post Inspection Options

    • Punch Out
    • Wire Grip and Rip
    • Ink Marking
    • XML Mapping
    • SECS/GEM E142 Format eMapping

  Products

  • Veeco
    Atomic Layer Deposition System...

  • Savannah®

    Savannah® has become the preferred system for university researchers worldwide engaged in ALD and looking for an affordable yet robust platform. Savannah®’s efficient use of precursors and power-saving features substantially reduces the cost of operating a thin film deposition system.

    Key features include:

    • In-Situ Ellipsometry
    • In-Situ QCM
    • Self Assembling Monolayers
    • 2-Second Cycle Times
    • Integrated Ozone
    • Low Vapor Pressure Deposition
    • Batch Processing
    • Glove Box Integration

    Fiji®

    Fiji® series is a modular, high-vacuum thermal ALD system that accommodates a wide range of deposition modes using a flexible architecture and multiple configurations of precursors and plasma gases. The Fiji G2 is a next-generation ALD system capable of performing thermal and plasma-enhanced deposition.

    Key features include:

    • Proprietary Chamber Turbo Pumping System
    • Improved Plasma Design
    • Ergonomic Operator Interface
    • In-Situ Ellipsometry
    • In-Situ Quartz Crystal Microbalance
    • Integrated Ozone
    • Glove Box Interface

    The Fiji® is available with up to six precursor lines that can accommodate solid, liquid or gas precursors, and six plasma gas lines, offering significant experimental flexibility in a compact and affordable footprint.

    Phoenix®

    The Phoenix® system is engineered for high throughput and maximum uptime in any fabrication environment, from pilot production to industrial-grade manufacturing. Technologists and researchers rely on the Phoenix® for repeatable, highly accurate film deposition on flat and 3D substrates alike. And with support for up to six individual precursor lines, the Phoenix® delivers solid, liquid, or gaseous process chemistries depending on your thin film needs. A compact footprint and innovative design makes the Phoenix® the practical choice for those with batch production ALD requirements.

    Key features include:

    • Precise software control of process parameters, including temperature, flow and pressure, for defect-free coatings on even the most sensitive substrates
    • Patented ALD Shield™ vapor trap to prevent build-up of deposits and minimizes excess process gases from being exhausted into the environment
    • Large process chamber accepts GEN 2.5 substrates, multiple wafer cassettes and larger 3D objects
    • Low cost of ownership with minimal startup and operational costs
    • Compact footprint that conserves valuable clean room space
    • Standard recipes and ALD materials readily available
    • Comprehensive support and services worldwide from technical team and PhD scientists

    CE, FCC, and CSA compliant with many built-in safety features

  • Bruker
    AFM, Optical Profilers, Stylus Profilers, Nanoindentors, XRD...

  • Dimension FastScan Pro

    The Dimension FastScan Pro delivers the highest metrology-level speed and performance of any industrial AFM available today. The system enables automated or semi-automated measurements while ensuring the utmost ease of use and the lowest cost per measurement for quality control, quality assurance, and failure analysis.

    Features:
    FastScan Pro utilizes an open-access platform, large- or multiple-sample holders, and numerous ease-of-use features to provide flexible high-performance nanoscale metrology for industrial QA, QC, and FA applications. The system delivers automated 2-inch to 12-inch wafer measurements for semi, data storage and HB-LED. It features increased XY sample travel for full access to 200mm wafers or multiple samples in 200-mm diameter area, with optional chucks for 300-mm wafers. The system also provides the choice between a high-throughput 5-10x FastScan scanner for topography, roughness and other metrology analyses, or an Icon scanner with 90µm scan range for larger scans and high-accuracy topography performance.

    ContourX Series - 3D Optical Profilometer

    The ContourX Optical Profilometer sets a new benchmark for accurate and repeatable non-contact surface metrology at a best-in-class price point. The small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities in a streamlined package that incorporates decades of proprietary Bruker white light interferometry (WLI) innovation. Next-generation enhancements include a new 5 MP camera and updated stage for larger stitching capabilities, and a new measurement mode, USI, for even greater convenience and flexibility for precision machined surfaces, thick films, and tribology applications. You will not find a benchtop system with better value than the ContourX.

    Fast and repeatable 3D Metrology

    • Industry-best Z resolution offers constant, precision measurements, independent of magnification
    • Largest standard field of view
    • Compact, vibration-tolerant design for highest stability and repeatability

    Superior Measurement and Analysis

    • Easy-to-use interface for quick and accurate results
    • Extensive library of filters and analysis options for roughness, surface texture, and critical dimension
    • Customized analysis reporting to industry standards, such as ISO 25178, ASME B46.1, ISO 4287

    Applications:

    • Roughness (Polished Glass, Oily Material, Photoresist, Silicon etc)
    • Warpage
    • Curvature
    • Topography

    Hysitron TI 990 TriboIndenter

    Bruker's next-generation Hysitron TI 990 TriboIndenter® sets new standards for performance, flexibility, and usability in nanomechanical and nanotribological characterization. A comprehensive advancement of Bruker’s industry-leading TriboIndenter platform, every aspect of TI 990's measurement and analysis process features updated technologies designed to remove the normal limitations of nanoindenter systems. As such, this system features the most measurement modes available and delivers high-precision measurements in the broadest range of laboratory environments.

    The TI 990 powerful base configuration provides a comprehensive understanding of material behavior at the nanoscale

    • Quantitative nanoscale-to-microscale indentation
    • Nanoscratch
    • Nanowear
    • High-resolution in-situ scanning probe microscopy (SPM) imaging
    • Dynamic nanoindentation and high-speed mechanical property mapping

    Stylus Profiler

    Dektak Pro® Stylus Profiler features a revolutionary design that enables even measure single-nanometer step heights and achieve better than 4 angstrom repeatability. This major milestone in stylus profiler performance is the culmination of fifty years of Dektak® innovation and industry leadership. Through its combination of industry firsts, Dektak Pro delivers the ultimate in performance, ease of use and value to enable better process monitoring from R&D to QC. The technological breakthroughs incorporated in Dektak enable critical nanometer-level surface measurements including the microelectronics, Film Coatings, Life Sciences.

    Working Principal: Stylus Profiler measured film thickness by contact stylus scanning

    • Stylus force 1-15 mg, with 0.03 mg low force option
    • The Dektak Pro’s self-aligning styli enables effortless tip exchange
    • Low Inertia sensor (LIS 3)
    • Smart electronics reducing errors and uncertainty in high-precision measurements.
    • Single arch design provides breakthrough scan stability
    • Vision 64 operation and analysis software

    Large-Sample analysis tool - Application for high throughput, accurate QA/QC!

    The Dektak XTL builds upon over 50 years of stylus expertise and application customization for production facilities
    to meet the stringent industry roadmaps of both today and tomorrow. The 300-millimeter, high-accuracy
    encoded XY staging gives manufacturers a reliable tool to meet stringent gage R&R requirements.

    Other hardware features include:

    • Single-arch architecture and integrated vibration isolation for industry-leading performance
    • Quick-change self-aligning stylus
    • High-accuracy encoded XY stage for faster automated data collection
    • N-Lite low force with Soft Touch technology and 1mm measurement range can be used simultaneously to measure delicate and high-vertical range samples
    • Dektak’s Dual Camera Control with high-magnification dual view cameras offers enhanced spatial awareness. Point-and-click positioning in the live video allows operators to quickly place samples at the right location for quick and easy measurement setup and automation programming
  • Semics
    Fully Auto Wafer Prober...

  • OPUS3 FD12

    OPUS3 FD12 is optimized prober that handles both Standard and Frame wafer. The Standard and Frame wafer can be converted by conversion kit conveniently. Alignment algorithm is advanced technology for various and special wafers. It makes high accuracy for consistent contact / probing and fast index time for higher throughput.

    Key features Overview

    • Universal wafer handling kit for Standard wafer & Frame wafer such as Thin, Sawn, Reconstructed and Mems wafer
    • Alignment algorithm to precisely measure die offset for film sagging
    • Support for all types of maps
    • Retest probing with Standard and Frame wafer
    • Easy & Fast conversion of Hardware and Software
    • Compact system size for space efficiency
    • Intelligent pin alignment algorithm
    • Accurate and various shapes of probe mark inspection
    • Compatible with all type of tester
    • Compatible with Pogo, DD type Card changer
    • Support for OCR and Barcode read
    • Optimized ESD technology

    OPERA (4x3 & 6x2)

    OPERA is only a group prober which is composed of real probers side by side and in a row. With this the greatest innovation, our customer will satisfy with greatest performance never expected before.

    Key features Overview

    • OPERA’s probing performance is exactly the same as opus mini & genie composed of real probers
    • Each cell has 800kgf Probing force
    • The most compact card changer module ever
    • Extremely simple, fast and safe probe card handling structure
    • Crazy sliding extension for maintenance of tester and prober
    • Extremely easy maintenance & accessibility
    • Anti-vibration mechanism
    • The fastest and robust wafer handling loader
    • Smart wafer pre-aligner and wafer buffer system
    • Very simple pogo tower structure for PIB and probe card
  • Suhwoo
    Strip Grinders...

  • SG-2000X Strip Grinders

    Applications:

    • Finger print sensor
    • TMV/TSV
    • Over mold
    • Exposed die
    • Thin die with over mold
    • Die with exposed die
    • Removal mold flash

    Features:

    • Full Auto System for Optimization Mass Production
      - SG-2000X is Full Auto System From Loading to Unloading.
      - It is Magazine to Magazine base Strip Grinding System for Mass Production.
    • Applying for Various Strip Size
      - Basic Composition is based on Strip Size: 62mm/74mm/95mm.
      - Optionallym possible for Applying Various Strip Size.
    • Quick & Easy conversion
      - Conversion All Parts in easy way (within 30minute).
    • High Grinding Accuracy
      - High Reliability for the System with high Grinding Accuracy (±10um)
    • Vision inspection
      - Automatically Inspect Crack, Chipping and Pollution by Vision Inspection.
    • Optimized for Mass Production
      - Composed with Rach Module Type of Loading, Grinding, Vision and Unload System.
  • Xinsheng Technology
    Auto-Molding Equipment...

  • Auto-Molding Equipment 自动塑封机

    STM-120

    产品应用

    1. QFN / DFN
    2. BGA / LGA
    3. FCBGA / FCLGA
    • 采用成熟技术设计,确保设备运行稳定
    • 采用模块化设计,方便组合及功能追加
    • 可搭载不同模具厂家的模具
    • 电气部品及主要零部件日本原厂生产
    • 针对不同产品的丰富可选功能
    • 现地化生产,及时的零部件供应及售后服务

    STM-180

    产品应用

    1. SOT / SOD
    2. SOP / QFP
    • 设备采用模块化设计,方便组合及功能追加
    • 可搭载不同模具厂商的模具生产
    • 电气部品及主要零部件采用日本原厂生产,保证品质
    • 针对不同产品,有丰富的可选功能
    • 设备现地化生产,及时的零部件供应及售后服务

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