Rehovot, Israel, March 18, 2025 - Nova (Nasdaq: NVMI) today announced that its co-authored paper with Samsung Electronics on “On-Cell Thickness Monitoring of Chalcogenide Alloy Layer using Spectral Interferometry, Raman Spectroscopy, and Hybrid Machine Learning” has been selected as the winner of the Vladimir Ukraintsev Award for “Collaborations in Metrology” at SPIE’s... Learn More
REHOVOT, Israel, February 3, 2025—Nova (Nasdaq: NVMI) announced today that it completed the acquisition of Sentronics Metrology GmbH, a privately held company headquartered in Germany. The transaction is valued at approximately $60 million, paid in cash. The Company expects the acquisition to be accretive on a non-GAAP net earnings basis within 12 months of ... Learn More
Rehovot, Israel – August 26, 2025 – Nova (Nasdaq: NVMI), today announced the release of its latest optical metrology solution, the Nova WMC. This next-generation modular platform has been specifically designed to address the complex requirements of the most advanced packaging applications in semiconductor manufacturing. The Nova WMC represents a breakthrough in... Learn More
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Link: https://news.skhynix.com/gauss-labss-ai-based-virtual-metrology-solution/... Learn More
Link: https://news.skhynix.com/gauss-labs-and-sk-hynix-present-ai-papers-at-spie-al-2024/... Learn More